Metrology Systems to meet our customers' demands for faster performance, easier operation and greater accuracy. Metrology Systems

 

LEXT OLS4100LEXT OLS4100

LEXT OLS4000

Certified accuracy and repeatability
High resolution (down to 120nm L&S)
Outstanding slope detection capability (up to 85°)
Roughness testing according to all standards
Advanced dual pinhole technology for superior flexibility







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